29 Jun Staff Engineer, Test Development
- Bayan Lepas, Penang
- Permanent
- Malaysians Only
Our client is an American-based MNC from the semiconductor industry. Currently looking for an Engineer to be responsible for test program development and integration.
JOB DESCRIPTION
- Design, develop, and deploy production test programs for FPGA and programmable
semiconductor devices on Advantest V93000 ATE platforms. - Architect scalable and reusable test frameworks that support multiple device families and
future product generations. - Develop and maintain test solutions for digital logic, embedded memory, configuration
interfaces, boundary scan, and functional validation requirements. - Create and manage test specifications, timing configurations, pin maps, level setups, and
pattern execution environments. - Drive device characterization, correlation, yield analysis, and production ramp activities.
- Collaborate with Design, DFT, Product Engineering, Validation, and Manufacturing teams
to ensure comprehensive test coverage and smooth product release. - Implement and validate manufacturing test features including scan, MBIST, JTAG,
boundary scan, and low-power test methodologies. - Perform silicon debug, root-cause analysis, and failure characterization to identify design,
process, or test-related issues. - Optimize test programs to improve throughput, reduce cost of test, and enhance
manufacturing efficiency while maintaining quality objectives. - Support new product introduction (NPI) activities, including hardware bring-up, probe card
validation, load board qualification, and tester release. - Analyze test data and yield trends to drive continuous improvement initiatives and improve
product quality.
A QUALIFIED CANDIDATE
- Bachelor’s or Master’s Degree in Electrical / Electronic Engineering or relevant discipline
- 5+ years’ experience in semiconductor test development
- Proven experience developing test programs on Advantest V93K (SmarTest 7)
- Experience in FPGA or programmable logic device testing
- Familiar with CRAM or embedded memory test methodologies
- Knowledgeable in high-speed interfaces (e.g., DDR, SerDes)